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Microscopy & Microanalysis 2010 Student Awards
August 1-5, 2010
Portland, OR


Once again we are offering travel awards to the annual Microscopy & Microanalysis conference. Students or Post-docs can apply for one of three $250 awards from TEMwindows.com. Attendees giving an oral presentation or poster with images or other data collected using any of our TEM Windows are eligible to apply. 

The images or other data must demonstrate usage of UltraSM® Pure Silicon, Silicon Oxide or Silicon Nitride TEM Windows in a research project. We only ask that presenters reference TEMwindows.com as a supplier under the appropriate images or figures (ex. Carbon nanotubes were imaged on 5 nm thick Pure Silicon TEM windows from TEMwindows.com). We are not seeking a detailed characterization of the product itself, rather we wish to demonstrate how our products can benefit researchers in their efforts. 

The images or data must be submitted to sales@TEMwindows.com by July 26, 2010. Images or data will not be published in any format without your permission. You retain full rights to your images. In no way do we wish to compromise the novelty of your work or your ability to publish in a peer-reviewed journal.

$250 will be awarded after the conference, pending confirmation of the image/data presentation. Awards will be granted to the first three qualified applicants. 

To apply, please email your image, presentation title, number and abstract to sales@TEMwindows.com by July 26, 2009. 

Meet Tom and Chris from TEMwindows.com Team at M&M 2010, Booth #551!


Tom and Chris will also be presenting two talks at M&M. Please stop by and say hello.

Tuesday August 3, 2010
A-01 Vendor Symposium: Creating the Tools for Science (Room B115)
1:45 PM 310 Advanced Imaging and Separation Tools Based on Ultra-thin Porous Silicon Membranes; CC Striemer; TR Gaborski, SiMPore, Inc

Thursday August 5, 2010
B-06 Microfluidic Devices: Emerging Platforms for Live Cell Microscopy (Room B115)
9:45 AM 803 Highly Permeable Membranes for Live Cell Imaging of Co-Cultures; TR Gaborski; BJ Nehilla; CC Striemer; JL McGrath; SiMPore, Inc & University of Rochester