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Silicon Nitride Lift-Out TEM Windows with gold contacts

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Our Price: $79.00
(Minimum order):  10

Stock Status:In Stock
Product Code: SN100-LFT-AU

Silicon Nitride (SiN) Half-Grids For Lift-Out Applications
100 micron thick frame, fits flip-stage SEM/FIB and standard TEM sample holders
  • 400 nm thick low-stress Silicon Nitride film
  • (1) 100 x 500 micron window with the free-edge along length
  • 200 nm thick gold contacts for in situ sample electrical biasing

What's NEW?
Our Silicon Nitride Lift-Out TEM Windows feature a large, robust window with a freely suspended side along one length of the window, providing an easily accessed edge for sample preparation and thinning. As part of sample preparation, the low-stress Silicon Nitride can be thinned by focused-ion beam to electron transparent thickness (e.g. 50 nm or less). To prevent charging during sample preparation, we recommend coating the underside of Lift-Out TEM Windows with ~5 nm amorphous carbon by placing the grids face-down (vs. as packaged) onto cleanroom paper while in a standard carbon evaporator.

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