Low-stress silicon nitride for lift-out applications
State Of The Art: Our expert engineering and MEMS fabrication processes allow us to provide these one of a kind silicon nitride lift-out grids.
Open Half-Grid Shape: Our Silicon Nitride Lift-Out TEM Windows feature a large, robust window with a freely suspended side along one length of the window, providing an easily accessed edge for sample preparation and thinning to electron transparency (e.g. 50 nm or less).
Ready To Use Gold Contacts: 200 nm thick gold contacts for sample electrical biasing or heating are formatted for FIB-based sample preparation methods.
Fit: The 100 micron thick frame and rounded half-grid shape fits flip-stage SEM/FIB holders and standard TEM sample holders.