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Low-stress silicon nitride for lift-out applications

  • State Of The Art: Our expert engineering and MEMS fabrication processes allow us to provide these one of a kind silicon nitride lift-out grids.
  • Open Half-Grid Shape: Our Silicon Nitride Lift-Out TEM Windows feature a large, robust window with a freely suspended side along one length of the window, providing an easily accessed edge for sample preparation and thinning to electron transparency (e.g. 50 nm or less).
  • Ready To Use Gold Contacts: 200 nm thick gold contacts for sample electrical biasing or heating are formatted for FIB-based sample preparation methods.
  • Fit: The 100 micron thick frame and rounded half-grid shape fits flip-stage SEM/FIB holders and standard TEM sample holders.

These Lift-Out TEM Windows were developed in partnership with Dr. Matthew Mecklenburg at the University of Southern California.
Download our Application Note describing how to attach sample lamella to our Lift-Out Grids.

The following featured publication describes the fabrication of our Lift-Out Grids.
Fabrication of a Lift-Out Grid with Electrical Contacts for Focused Ion Beam Preparation of Lamella for In Situ Transmission Electron Microscopy. Mecklenburg et al. (2013) Microscopy and Microanalysis. 19: 458-459.
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Silicon Nitride Lift-Out TEM Windows with gold contacts

Our Price: $79.00
Silicon Nitride Lift-Out TEM Windows

Our Price: $49.00