|
|
Welcome.
|  | M&M
2009 Student & Post-doc
Travel Awards
Students
and Post-docs attending Microscopy & Microanalysis 2009 (July
26-30, Richmond, VA) can receive one of four $500 travel awards for
presenting images or other data using UltraSM® Silicon TEM Windows.
Read more »
Meet the TEMwindows.com Team at M&M 2009 - Booth #613! (We are across the aisle from Hitachi)
|
|
Amorphous UltraSM®
Silicon:
Half the Chromatic Blur and No Organic
Contamination
A
comparison analysis of the thinnest amorphous carbon and 5 nm
amorphous UltraSM® Silicon TEM Windows revealed that UltraSM®
Silicon TEM Windows:
- Yield half the inelastic scattering of ultra-thin amorphous
carbon
- Are 35%+ thinner
- Tolerate aggressive plasma cleaning and high-beam currents
These
results were obtained through a grant program at Cornell University
in collaboration with Dr. David Muller, Associate Professor of
Applied and Engineering Physics.
See how UltraSM® Silicon TEM
Windows can enable the preparation of higher quality samples,
leading to improved imaging and reduced instrument time.
Read
more » |
Not sure which TEM Window film is the best for your work? See our Application Guide.
If you don't see what you're looking for, give us a call at 1-888-323-6266
|
|
|
